[1] Shanshan Lv, Zhen He, A. Valeria Quevedo, Yiming Zhang Mirabile, and G. Geoffrey Vining. Process optimization using sequential design of experiment: A case study. Quality Engineering, 2019, 31(3), 473-483.

[2] Shanshan Lv, Zhiqiong Wang, Zhen He*, Geoffrey Vining. Impact of censoring types on the two-stage method for analyzing reliability experiments with random effects. Quality Engineering, 2019, 31(2), 302-313.

[3] Guodong Wang, Li Shao, Honggen Chen, Qingan Cui, Shanshan Lv*. Calculating confidence intervals for percentiles of accelerated life tests with subsampling. Quality Technology & Quantitative Management, 2019, 16(4), 424-438.

[4] Shanshan Lv, Zhanwen Niu, Qingan Cui, Zhen He*, Guodong Wang. Reliability improvement through designed experiments with random effects. Computers & Industrial Engineering, 2017, 112, 231-237.

[5] Shanshan Lv, Zhanwen Niu, Guodong Wang, Liang Qu, Zhen He*. Lower Percentile Estimation of Accelerated Life Tests with Nonconstant Scale Parameter. Quality and Reliability Engineering International, 2017, 33（7）, 1437-1446.

[6] Shanshan Lv, Zhen He, G. Geoffrey Vining. Simultaneous Optimization of Quality and Reliability Characteristics through Designed Experiment. Quality Engineering, 2017, 29(3), 344-357.

[7] Guodong Wang*, Zhen He, Li Xue, Qingan Cui, Shanshan Lv, Panpan Zhou. Bootstrap analysis of designed experiments for reliability improvement with a non-constant scale parameter. Reliability Engineering & System Safety, 2017, 160, 114-121.

[8] Guodong Wang, Zhanwen Niu, Shanshan Lv, Liang Qu, Zhen He*. Bootstrapping analysis of lifetime data with subsampling. Quality and Reliability Engineering International, 2016, 32(5), 1945-1953.

[9] Shanshan Lv, Zhanwen Niu, Liang Qu, Shuguang He, Zhen He*. Reliability Modeling of Accelerated Life Tests with Both Random Effects and Nonconstant Shape Parameters. Quality Engineering, 2015, 27(3), 329-340.

[10] Shanshan Lv, Zhanwen Niu, Zhen He*, Liang Qu. Estimation of lower percentiles under a Weibull distribution. 2015 First International Conference on Reliability Systems Engineering (ICRSE), 2015, , 1-6.